About the Conference
The 19th International Conference Reliability and Stress-related Phenomena in Nanoelectronics ("STRESS WORKSHOP"), will take place in West Lafayette, Indiana – USA, from 28 September-1 October 2026.
The conference will provide a focused forum for the presentation and discussion of current research on stress-induced phenomena in on-chip metal interconnects, solder joints, and related microelectronic structures.
In the spirit of previous editions, the 2026 conference will highlight new research results, encourage in-depth technical discussions, and promote advances in fundamental understanding.
Looking forward to welcoming you in West Lafayette,
STRESS WORKSHOP-2026 Chairs
Prof. Francesca Iacopi | Prof. Ganesh Subbarayan
The Stress Workshop 2026 is hosted by:
