About the Conference
The 19th International Conference Reliability and Stress-related Phenomena in Nanoelectronics ("STRESS WORKSHOP"), will take place in West Lafayette, Indiana – USA, from 28 September-1 October 2026.
The conference will provide a focused forum for the presentation and discussion of current research on stress-induced phenomena in on-chip metal interconnects, solder joints, and related microelectronic structures. As device scaling continues and new materials are introduced, understanding the origins and impacts of mechanical stress becomes increasingly critical for ensuring long-term reliability and performance.
In the spirit of previous editions, the 2026 conference will highlight new research results, encourage in-depth technical discussions, and promote advances in fundamental understanding that support the development of robust and reliable microelectronic systems.
Looking forward to welcoming you in West Lafayette,
Prof. Francesca Iacopi
STRESS WORKSHOP-2026 Chair